About Us

 

The Carleton Nano Imaging Facility (NIF) is home to two state-of-the-art Electron Microscopes, Tescan VegaII XMU SEM and FEI Tecnai G2 TEM.

The tungsten Tescan VegaII SEM images specimen surface profiles and topographies at variable pressures. It is operational at high vacuum for maximum resolution or low vacuum for direct imaging of fresh unprocessed biological specimens. It is equipped with Oxford X-ray detection systems (INCA EDS) for elemental analysis and quantitative mapping. A Cryo stage is also available for the low-temperature operation.

The FEI Tecnai G2 TEM reveals specimen information down to the atomic level where it reaches a stunning 1-million magnification. The FEI Tecnai G2 features a field emission source which makes the ultra-high resolution imaging possible - a spatial resolution as small as 0.144nm can be achieved. The Tecnai G2 is equipped with the latest Oxford X-ray detection systems – Aztec EDS which offers high-degree accuracy at a fast data acquisition speed.

Our staffs at the Carleton Nano Imaging Facility are available to assist users at all levels of expertise.  We offer a full spectrum of technical support that ranges from training courses, to sample preparation, to instrument operation and energy dispersive x-ray analysis.   Academic, government, and commercial users are welcome to take advantage of our expertise. Our facility is not-for-profit and we offer very competitive rates.  Discounts are available for academic or frequent users.